Search results for "Photoemission electron microscopy"
showing 10 items of 55 documents
Quantification of propagating and standing surface acoustic waves by stroboscopic X-ray photoemission electron microscopy.
2018
The quantification of surface acoustic waves (SAWs) in LiNbO3 piezoelectric crystals by stroboscopic X-ray photoemission electron microscopy (XPEEM), with a temporal smearing below 80 ps and a spatial resolution below 100 nm, is reported. The contrast mechanism is the varying piezoelectric surface potential associated with the SAW phase. Thus, kinetic energy spectra of photoemitted secondary electrons measure directly the SAW electrical amplitude and allow for the quantification of the associated strain. The stroboscopic imaging combined with a deliberate detuning allows resolving and quantifying the respective standing and propagating components of SAWs from a superposition of waves. Furth…
Defektanalyse von a-C- und CNx-Schichten mittels Röntgen-Photoemissions-Elektronenmikroskopie (X-PEEM)Characterization of stoichiometric defects in d…
2001
Amorphe Kohlenstoff- und Kohlenstoffnitridschichten werden vielseitig als Schutzschichten in der Industrie verwandt. Insbesondere werden in der Magnetfestplattenspeicherindustrie verschleisfeste sauerstoffundurchlassige Schutzschichten von wenigen Nanometern Dicke benotigt. Rontgen-Photoemissions-Elektronenmikroskopie (X-PEEM) stellt eine Analysetechnik zur Charakterisierung u.a. von Kohlenstoffschutzschichten dar, da sich Informationen uber die lokale Bindungsumgebung aus der Rontgenabsorptions-Nahkantenstruktur (XANES) gewinnen lassen. CVD-DLC- sowie a-C- und CNx-Schichten wurden analysiert. Fur die a-C-Schichten auf Si (100) wurde der Anteil sp2-hybridisierter Atome bestimmt und mit den …
Nondestructive full-field imaging XANES-PEEM analysis of cosmic grains
2006
For chemical analysis of submicron particles, mass spectrometric methods have the disadvantage of being destructive. Thus, a nondestructive elemental and chemical mapping with a high spatial resolution prior to mass analysis is extremely valuable to precharacterize the sample. Here, first results are presented of combined XANES (x-ray absorption near-edge structure) and PEEM (photoemission electron microscopy) measurements on a cosmic grain fraction from the Murchison meteorite. This nondestructive full-field imaging method is well suited for a quantitative analysis and for a preselection prior to detailed mass spectrometric investigations with isotopic resolution/selectivity. A spectral un…
Real-space observation of xenon adsorption and desorption kinetics on graphite (0001) by photoemission electron microscopy
2003
Abstract The growth and desorption of Xe monolayers on the basal plane of graphite has been investigated by real-space imaging using photoemission electron microscopy. Adsorption kinetics was studied at different substrate temperatures (39–65 K), corresponding to different growth modes. Coexisting phases showed up as different grey values in the image. Typical domain sizes of the 2D solid phases around 60 K are of the order of one to several μm. The domains exhibit an elongated shape with their long axis oriented preferentially parallel to step edges of the substrate. With increasing coverage the brightness of the domains increases, the 2D gas-phase regions shrink and finally disappear at h…
Time-of-flight photoemission electron microscopy – a new way to chemical surface analysis
2001
Abstract The time structure of synchrotron radiation at BESSY I (Berlin) was utilised to operate a photoemission electron microscope in the time-of-flight mode. The electrons that are emitted from the sample surface with different energies are dispersed in a drift tube subsequent to the imaging optics. Two ways of fast image detection have been explored, a fast gated intensified CCD camera (800 ps gate time) and a special counting electronics in combination with a 3D (x,y,t)-resolving delay line detector ( time resolution ps). The latter device has a lateral resolution of about 50 μm in the image plane being equivalent to 1000 pixels along the image diagonal. An energy resolution of 400 meV…
Temperature-induced martensite in magnetic shape memory Fe2MnGa observed by photoemission electron microscopy
2012
The magnetic domain structure in single crystals of a Heusler shape memory compound near the composition Fe2MnGa was observed during phase transition by photoelectron emission microscopy at Beamline 11.0.1.1 of the Advanced Light Source. The behavior is comparable with recent observations of an adaptive martensite phase in prototype Ni2MnGa, although the pinning in the recent work is an epitaxial interface and in this work the effective pinning plane is a boundary between martensitic variants that transform in a self-accommodating way from the single crystal austenite phase present at high temperatures. Temperature dependent observations of the twinning structure give information as to the …
The effect of magnetic anisotropy on the spin configurations of patterned La(0.7)Sr(0.3)MnO3 elements.
2013
We study the effect of magnetocrystalline anisotropy on the magnetic configurations of La0.7Sr0.3MnO3 bar and triangle elements using photoemission electron microscopy imaging. The dominant remanent state is a low energy flux-closure state for both thin (15 nm) and thick (50 nm) elements. The magnetocrystalline anisotropy, which competes with the dipolar energy, causes a strong modification of the spin configuration in the thin elements, depending on the shape, size and orientation of the structures. We investigate the magnetic switching processes and observe in triangular shaped elements a displacement of the vortex core along the easy axis for an external magnetic field applied close to t…
Investigation of a novel material for magnetoelectronics: Co2Cr0.6Fe0.4Al
2003
Heusler compounds are promising candidates for future spintronics device applications. The electronic and magnetic properties of Co2Cr0.6Fe0.4Al, an electron-doped derivative of Co2CrAl, are investigated using circularly polarized synchrotron radiation and photoemission electron microscopy (PEEM). Element specific imaging reveals needle shaped Cr rich phases in a homogeneous bulk of the Heusler compound. The ferromagnetic domain structure is investigated on an element-resolved basis using x-ray magnetic circular dichroism (XMCD) contrast in PEEM. The structure is characterized by micrometre-size domains with a superimposed fine ripple structure; the lateral resolution in these images is abo…
IMAGING OF DICHROISM IN PHOTOEMISSION ELECTRON MICROSCOPY AT NONMAGNETIC MATERIALS USING CIRCULARLY POLARIZED SOFT X-RAYS
2002
A new approach for investigations of circular dichroism in the angular distribution of photoelectrons (CDAD) is presented. The image contrast using a photoemission line of a certain material is combined with imaging of the angular distribution pattern using a photoemission electron microscope (PEEM). CDAD can be used to investigate pure scattering information by means of the same instrument in microscopically selected regions on a surface. The experiment combines angle-resolved XPS imaging with the indirect mapping of the local environment of atoms by means of CDAD holography. In a conventional photoelectron diffraction or photoelectron holography experiment, it is necessary to move the sa…
High-pass energy-filtered photoemission electron microscopy imaging of dopants in silicon.
2008
Differently doped areas in silicon can show strong electron-optical contrast in dependence on the dopant concentration and surface conditions. Photoemission electron microscopy is a powerful surface-sensitive technique suitable for fast imaging of doping-induced contrast in semiconductors. We report on the observation of Si (100) samples with n- and p-type doped patterns (with the dopant concentration varied from 10(16) to 10(19) cm(-3)) on a p- and n-type substrate (doped to 10(15) cm(-3)), respectively. A high-pass energy filter of the entire image enabled us to obtain spectroscopic information, i.e. quantified photo threshold and related photoyield differences depending on the doping lev…